A Critical Charge Model for Estimating the SET and SEU Sensitivity: A Muller C-Element Case Study

Abstract - This paper presents a critical charge model for estimating the SET and SEU robustness. The proposed model has been derived by analytic fitting of SPICE results, using a Muller C-element designed in 65 and 130 nm bulk CMOS technologies as the target device. The critical charge is expressed in terms of the size of C-element, size of load inverter, supply voltage and temperature, for constant timing parameters of the SET/SEU current pulse. The proposed model could be utilized to calculate the critical charge causing a SET, for both analyzed technologies, with the accuracy comparable to SPICE simulations. The critical charge for SEU was higher than for SET, but the dependencies obtained for SET response were qualitatively similar to those for SEU. This implies that the proposed critical charge model may be applicable for optimizing the SET/SEU robustness evaluation of the circuits involving the Muller C-element. Moreover, the model may also serve as a basis for evaluating the SET/SEU robustness of other standard cells and other technologies, and thus also for analysis of the SET/SEU robustness of complex circuits.